-Guest Editorial- R. F Wolffenbuttel and C. J. van Mullen, pp. 1467 -The Relationship Between Microsystem Technology and Metrology-R. F Wolffenbuttel and C J. van Mullen, pp. 1469 -IC Fabrication Compatible Processing for Insirumentation and Measurement Applications-D.D. L. Wijngaards and R F Wolfenbuttel, pp. 1475 -Development of Thin-Film Multijunction Thermal Converters at PTB/IPHT-M. Klo…
-Guest Editorial-G. Jones, pp. 476 -Foreword-S. Pollit, pp. 478 -Ac Power Measurements; Callibration System For Electronic Instrument Transformers With Digital Output-B.Djokic And E. So, pp. 479 -Precision Measurement Of Power Harmonics And Flickers-I. Budovski And G. Hammond, pp. 483 -A Wavelet-Based Method Of Measuring Fluctuating Harmonics For Determining The Filter Time Constant Of IEC …