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IEEE Transactions On Instrumentation And Measurement: A Publication Of The …
-Guest Editorial- R. F Wolffenbuttel and C. J. van Mullen, pp. 1467 -The Relationship Between Microsystem Technology and Metrology-R. F Wolffenbuttel and C J. van Mullen, pp. 1469 -IC Fabrication Compatible Processing for Insirumentation and Measurement Applications-D.D. L. Wijngaards and R F Wolfenbuttel, pp. 1475 -Development of Thin-Film Multijunction Thermal Converters at PTB/IPHT-M. Klo…
- Edisi
- Vol.50, No.6, December 2001
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 1467-1835 hlm, ill; 30cm
- Judul Seri
- -
- No. Panggil
- REF 620 TIM i
IEEE Transaction on INSTRUMENTATION AND MEASUREMENT : A Publication of the IE…
IEEE Transaction on INSTRUMENTATION AND MEASUREMENT : A Publication of the IEEE Instrumentation and Measurement Society, Volume 51 Number 5, October 2002 contains of: - Measurement of pesticide residues in food based on diffuse reflectance IR spectroscopy - Hiroaki, Toyonori, Eiji, pp. 886 - Slow-wave structures-based method of measurements - Pchelnikov and D.S. Nyce, pp. 891 - Head-Disk Spa…
- Edisi
- Volume 51 Number 5, October 2002
- ISBN/ISSN
- 0018-9359
- Deskripsi Fisik
- pp. 886-985
- Judul Seri
- -
- No. Panggil
- REF 620 TIM i c.1
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