-Guest Editorial- R. F Wolffenbuttel and C. J. van Mullen, pp. 1467 -The Relationship Between Microsystem Technology and Metrology-R. F Wolffenbuttel and C J. van Mullen, pp. 1469 -IC Fabrication Compatible Processing for Insirumentation and Measurement Applications-D.D. L. Wijngaards and R F Wolfenbuttel, pp. 1475 -Development of Thin-Film Multijunction Thermal Converters at PTB/IPHT-M. Klo…
-Improving the Convergence Rate of Jansson's Deconvolution Method-P. B. Crilly, A. Bernardi, P. A. Jansson, and L. E. B. da Silva, pp. 1142 -Capacitive Sensor for Relative Angle Measurement- P. Fulmek, F. Wandling, W. Zdiarsky, G. Brasseur, and S. Cermak, pp. 1150 -Effects of DUT Mismatch on the Noise Figure Characterization: A Comparative Analysis of Two Y-Factor Techniques-J.-M. Collantes, …
-Study of Micromanipulation Using Stereoscopic Microscope- H. Yamamoto and T. Sano, pp. 182 -Flatness Measurement System Based on a NonLinear Optical Triangulation Technique- D. F Garcia, M. Garcia, F. Obeso, and V. Fernandez, pp. 188 -Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Networks- M. Catelani a…
-First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 1559 -Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence characterization-S. R. Das, C. V Ramamoorthy, M. H. Assaf E. M. Petriu, W-B. Jone, and M. Sahinoglu, …
-Guest Editorial-r. Sasdelli, pp. 994 -A Real-Time Remote Control Architecture Using Mobile Communication-C.E Lin, C.-C.Li, A.-S. Hou And C.C. Wu, Pp. 997 -Phase Reconstruction Of Modulated Ultrasonic Signals And New Measurement Technique Of Flow Velocity-M.J. Niemann And V. H. Hans, Pp. 1004 -Minimum-Entropy, PDF Approximation, And Kernel Selection For Measurement Estimation-J.L. De La Rosa…
-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…
-Special Section on IST 2004- G. C. Giakos, pp. 1867 -Design and Implementation of Web-Based Systems for Image Segmentation and CBIR-M. Antonelli, S. G. Dellepiane, and M. Goccia, pp. 1869 -An Innovative Microwave-Imaging Technique for Nondestructive Evaluation: Applications to Civil Structures Monitoring and Biological Bodies Inspection-M. Benedetti, M. Donelli, A. Martini, M. Pastorino, A…
-New Digital Signal-Processing Approach for Transmitter Measurements in Third Generation Telecommunications Systems-L. Angrisani, M. D'Apuzzo, and M. D'Arco, pp. 622 -Neuro-Fuzzy TSK Network for Calibration of Semiconductor Sensor Array for Gas Measurements-S. Osowski, T. H. Linh, and K. Brudzewski, pp. 630 -Neuro-Fuzzy Network for Flavor Recognition and Classification-S. Osowski, T. H. Linh,…
-Guest Editorial-Ottoboni and S. Demidenko, pp. 1346 -With Leakage Minimization-D.Agrez, pp. 1347 -Digital Processing of Dual-Frequency Servo Burst in Hard Disk Drives- A. Al Mun. G. Guo, K. C. Tan, And Y.Liu, pp. 1354 -A Digital Tachometer for High-Temperature Telemetry Utilizing uprated Commercial Electronic Components- D. Ambrush, V. Bilas, And D. Vasic, pp. 1361 -Effects of Driving Mod…
-A Virtual Instrument For Automatic Anemometer Calibration With ANN Based Supervision-F. Lopez Pena And R. J. Duro, pp. 654 -3-D Motion System (“Data Gloves”): Application For Parkinson Desease-Y. Su, C.R. Allen, D. Geng, D. Burn, U, Brechany, G. D. Bell, And R. Rowland, pp. 62 -A Fuzzy Linguistic-Based Software Tool For Seismic Image Interpretation-L. Valet, G. Mauris, P. Bolon, And N. K…