Ditapis dengan

  • Tahun Penerbitan
  • Ketersediaan
  • Lampiran
  • Tipe Koleksi
    Lihat Lebih Banyak
  • Format Fisik Dokumen
    Lihat Lebih Banyak
  • Lokasi
    Lihat Lebih Banyak
  • Bahasa
Ditemukan 1543 dari pencarian Anda melalui kata kunci: author=V
Hal. Awal Sebelumnya 51 52 53 54 55 Berikutnya Hal. Akhir
cover
: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
Komentar Bagikan
B. P. GollompI. GoleckiP. NiewcaszL. DziudaG. FusiekJ.R. McdonaldJ. ChenW. J. BockW. ZhengH.P. SardesaiM.G. TaylorD. L. Craig, J. FowlkesJ.R. SimpsonP. MihailovicS. PetricevicZ. StojkovicJ. B. RadunovicT.C. HutchinsonF. KuesterE.M. Yeatman, P.J. KushnerD.A. RobertsP. Pfeiffer,M. MeyrueisD. PatillonF. BounaixA. Di Donato, L. ScaliseL. ZappeliP.G. PapageorgasD. MaroulisH. WinterS.A. KarkanisH. AlbrechtN.G. TheofanousJ.-N. MaranR. SlavikS. LarochelleS. -L. TsaoW.-M. ChengZ. J. AleksicA. GaltarossaL. Palmieri

-Guest Editorial-B. P. Gollomp And I. Golecki, pp. -Dynamic Strain Measurement Using An Extrinsic Fabry-Perot Interferometric Sensor And An Arrayed Waveguide Grating Devices-A. J. Willshire, P. Niewcasz, L. Dziuda, G. Fusiek, And J.R. Mcdonald,pp. 4 -A Novel Fiber-Optic Pressure Sensor Operated At 1300-Nm Wavelength-J. Chen And W. J. Bock, p. 10 -Measurement And System Impact Of Multipath I…

Edisi
VOL.53, NO.1, FEBRUARY 2004
ISBN/ISSN
0018-9456
Deskripsi Fisik
4-232 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
R. ArseneauL. CallegaroG. JonesS. PollitB.DjokicE. SoI. BudovskiG. HammondP. ClarksonP. S. WrightG.A KyriazisM.L. R. De CampposD. SlomovitzH. De SouzaE. HaniqueD. Angelo, T. TsuchiyamaT. TadakoroB.C. WaltripT.L. NelsonJ. SchuurB.M. WoodF. OverneyS.A. AwanB.P. KibbleG. RammH. MoserR.E. ElmquistE. HourdakisD.G. JarretN. M. ZimmermanF. DelahayeR. GoebelH.J. KimYu. P. Semenov

-Guest Editorial-G. Jones, pp. 476 -Foreword-S. Pollit, pp. 478 -Ac Power Measurements; Callibration System For Electronic Instrument Transformers With Digital Output-B.Djokic And E. So, pp. 479 -Precision Measurement Of Power Harmonics And Flickers-I. Budovski And G. Hammond, pp. 483 -A Wavelet-Based Method Of Measuring Fluctuating Harmonics For Determining The Filter Time Constant Of IEC …

Edisi
VOL.54, NO.2, APRIL 2005
ISBN/ISSN
0018-9456
Deskripsi Fisik
476-936 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
D. GrimaldiP.M.T. Broersen And R. BosL. AngrisaniV. HaaszA. SachenckoJ. ZakrzewskiW. DomanskiP. ChaitasT. LaopulosW. WinieckiL. De VitoS. RapuanoG. TrugliaY. V. KolokolovS. L. KoschinskyV.V. BagrovT. AnderssonP. HandelR. Schiano Lo MorielloJ.F. ArrigoP.M ChauA.A. BarannikN.T. CherpakD.E. ChuykoD.W. Braudaway

-Special Section On The Intelligent Data Acquisition And Advanced Computer Systems( IDAACS) Workshop-V. Haasz And A. Sachencko, pp. 3 -Time-Of-Flight Measurement Of Ultrasonic Pulse Echoes Using Wavelet Networks-D. Grimaldi, pp. 5 -Improving Sensitivity And Selectivity Of Sno2 Gas Sensors By Temperature Variation-J. Zakrzewski, W. Domanski, P. Chaitas And T. Laopulos, pp. 14 -Methodology Of …

Edisi
VOL.55, NO.1, FEBRUARY 2006
ISBN/ISSN
0018-9456
Deskripsi Fisik
3-374 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
Komentar Bagikan
Fak. HukumU. FellerJ. L. HallJ. YeL.-S. MaJ.-M. ChartierH. KarlssonE. PrietoR.S. WindellerS. PicardL. RobertssonP. JuncarJ.-P. WallerandP. BallingP. Kren,K. NyholmM. MerimaaT.E. AholaF. -L. HongF.-L. HongJ. IshikawaK. Sugiyama, A, Onae, H. Matsumoto, J. Ye, And J.L. HallU. Tanaka, J.C. Bergquist, S. Bize, S.A. Diddams, R.E. Drullinger, L. Hollberg, W.M. Itano, C.E. TanJ. Helmcke, G. Wilpers, T. Binnewies, C. Degenhardt, U. Sterr, H. Schantz, And F. RiehleI. Courtillot, A. Quessada, R.P. Kovavich, J.-J. Zondy, A. Landragin, G. Santarelli, A. Clairon, AndJ. Vanier, M.W. Levine, D. Janssen, And M.J. DelaneyT.Y. KwonH.S. LeeS.H. YangS.E. ParkF. LeviL. LoriniD. CalonicoA. Godone

-Guest Editorial-U. Feller, pp. 225 -Optical Frequency Standards And Measurement-J. L. Hall, And J. Ye, pp. 227 -The BIPM Laser Standards At 663 Nm And 532 Nm Simultaneously Linked To The SI Second Using A Femtosecond Laser In In An Optical Clock Configurations- L.-S. Ma, L. Robertsson, S. Picard, J.-M. Chartier, H. Karlsson, E. Prieto, And R.S. Windeller, pp.32 -Results From International …

Edisi
VOL.52, NO.2, APRIL 2003
ISBN/ISSN
0018-9456
Deskripsi Fisik
225-651 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
Komentar Bagikan
S. MouradS.R. DasJ. SavirR.X. GaoD. KayS.ChungK.A. TaylorB. NelsonA. ChongH. LinE. ChanM. SomaH. HaggagJ. HuardJ. BraatzA.S. HouC.-L. HsuY. LaiS.-W. WangJ.W. SheppardM.A. KaufmanA. JoskoR.J. RakM. AielloA. CataliottiS. NuccioC. Alippi,M. CatelaniA. FortM. MugnainiB. AndoS. GrazianoP. Pitrone

-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…

Edisi
VOL.54, NO.3, JUNE 2005
ISBN/ISSN
0018-9456
Deskripsi Fisik
939-1342 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
S. MouradFak. HukumE. M. PetriuS.R. DasR. RajsumanK. ChakabartyM. SeuringM. SudarmaM.H. AssafW.-B. JoneM. SahinogluD.C. HuangP.K. LalaA. L. BurresS.L. LinS. KrishnanJ. SavirZ. GuoA.M. ShethS.F.-C. TsengW.T.-K. ChienE. GongB.-C CaiS. BaglioL. AntoniR. LeveugleB. FeherS.Y.C. CatundaJ.-F. NavinerG. S. DeepR.C.S. FreireS. Abou ChahineB. HuyartJ. AchkarS. Chen,D.-Y. JengH. HadanoY. IshiguroM. NayakamaK. WatanabeT. Chiu

-Guest Editorial-S.R. Das And R. Rajsuman, pp. 1350 -Space Compaction Of Test Responses Using Orthogonal Transmission Functions- K. Chakabarty And M. Seuring, pp. 1353 -Parity Bit Signature In Response Data Compaction And Built-In Self-Testing Of VLSI Circuits With Nonexhaustive Test Sets-S.R. Das, M. Sudarma, M.H. Assaf, E. M. Petriu, W.-B. Jone, K. Chakrabarty, And M. Sahinoglu, pp. 1363 …

Edisi
VOL.52, NO.5, OCTOBER 2003
ISBN/ISSN
0018-9456
Deskripsi Fisik
1350-1692 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
R. Z. MorawskiV.D. DesnicaLj. D. ZivanovO. S. AleksicM. LukovicM.D.NimrihterN. DedeneR. PintelonP. LataireA.H. TanK.R. GodfreyS.O. NelsonP. G. Bartley, JrY. -W. Chen, N.E. MendozaZ. NakaoT. AdachiR. ArseneauM.E. SutherlandJ.J. ZelleM. NiemannV. HansR. StormK. KolahiH. RockS. Van AertA. J. Den DekkerA. Van Den BosD. Van DyckC. BergerJ. Lim, Q. YangB.E. JonesP.R. JacksonL. CallegaroG.C. BoscoP.P. CapraD. SerazioV.D’ EliaU. PoglianoM.D. CordeaD.C. PetriuE. M. PetriuN.D. GeorganasT. E. WhalenM. DemereyeE. Dereine, C. EugeneV. Naydenov

-Guest Editorial-R. Z. Morawski, pp. 567 -List Of Reviewers-R. Z. Morawski, pp. 568 -Comparative Characteristic Of Thick-Film Integrated LC Filters-V.D. Desnica, Lj. D. Zivanov, O. S. Aleksic, M. Lukovic, And M.D.Nimrihter, pp. 570 -Measurement Of Multivariable Frequency Response Functions In The Presence Of Nonlinear Distortion—Some Practical Aspect-N. Dedene,R. Pintelon, And P. Lataire…

Edisi
VOL.51, NO.4, AUGUST 2002
ISBN/ISSN
0018-9456
Deskripsi Fisik
567-881 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
A.R. Varkonyi -KoczyR. TadeusiewiczL. StankovicS. DjukanovicS. GrajaJ.-M. BoucherJ.K. TarI.J. RudasA. SzeghegyiAnd A.K. HolmesG.N. BeligiannisL.V. SkarlasS.D. LikothanassisK.G. PerdikouriP. BaranyiN. PapandreouT. AntokanapuolosJ. DoiM. YamanakaM.M. Madeira E Moura, A. LeiriaM.G. RuanoP. BerenyiG. HorvathV. LampaertJ. SweversJ. Arenas-GraciaV. Gomez-VerdejoA.R. Figueras-VidalP.T. SzemesH. HashimotoP. Korondi

- Special Section On Intelligent Signal Processing-A.R. Varkonyi -Koczy, pp. 2147 - Nonlinear Processing And Semantic Content Analysis In Medical Imaging-M.R. Ogiela And R. Tadeusiewicz, pp. 2149 -Order Adaptive Local Polynomial FT Based Interference Rejection In Spread Spectrum Communication Systems-L. Stankovic And S. Djukanovic, pp. 2156 -Hidden Markov Tree Model Applied To ECG Delineatio…

Edisi
VOL.54, NO.6, DECEMBER 2005
ISBN/ISSN
0018-9456
Deskripsi Fisik
2135-2556 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
M. ChoiN. ParkF. LombardiV. SahniV.P. PyaraC. BolchiniL. PomanteF. SaliceD. ScuitoB. JinK.M. GeorgeM. YearyL. SchianoC. MetrtaD. MarinoP. DrineasY. MakrisT. XiaJ.-C. LoY.J. LeeT. KaneJ.-J. LimY.-B. KimF.J. MeyerS. MaxM.S. DragicM. Margala

-Guest Editorial-N. Park And F. Lombardi, pp. 1694 -Special Selection Papers: An Embryonic Approach To Reliable Digital Instrumentation Based On Evolvable Hardware-V. Sahni And V.P. Pyara, pp. 1696 -The Design Of Reliable Devices For Mission-Critical Applications-C. Bolchini, L. Pomante, F. Salice, And D. Scuito, pp. 1703 -Modeling And Analysis Of Soft -Test/Repair For CCD-Based Digital X-Ra…

Edisi
VOL.52, NO.6, DECEMBER 2003
ISBN/ISSN
0018-9456
Deskripsi Fisik
1694-1902 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
Hal. Awal Sebelumnya 51 52 53 54 55 Berikutnya Hal. Akhir