-First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 1559 -Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence characterization-S. R. Das, C. V Ramamoorthy, M. H. Assaf E. M. Petriu, W-B. Jone, and M. Sahinoglu, …
-Special Section on IST 2004- G. C. Giakos, pp. 1867 -Design and Implementation of Web-Based Systems for Image Segmentation and CBIR-M. Antonelli, S. G. Dellepiane, and M. Goccia, pp. 1869 -An Innovative Microwave-Imaging Technique for Nondestructive Evaluation: Applications to Civil Structures Monitoring and Biological Bodies Inspection-M. Benedetti, M. Donelli, A. Martini, M. Pastorino, A…
-New Digital Signal-Processing Approach for Transmitter Measurements in Third Generation Telecommunications Systems-L. Angrisani, M. D'Apuzzo, and M. D'Arco, pp. 622 -Neuro-Fuzzy TSK Network for Calibration of Semiconductor Sensor Array for Gas Measurements-S. Osowski, T. H. Linh, and K. Brudzewski, pp. 630 -Neuro-Fuzzy Network for Flavor Recognition and Classification-S. Osowski, T. H. Linh,…
-Guest Editorial-Ottoboni and S. Demidenko, pp. 1346 -With Leakage Minimization-D.Agrez, pp. 1347 -Digital Processing of Dual-Frequency Servo Burst in Hard Disk Drives- A. Al Mun. G. Guo, K. C. Tan, And Y.Liu, pp. 1354 -A Digital Tachometer for High-Temperature Telemetry Utilizing uprated Commercial Electronic Components- D. Ambrush, V. Bilas, And D. Vasic, pp. 1361 -Effects of Driving Mod…
-A Virtual Instrument For Automatic Anemometer Calibration With ANN Based Supervision-F. Lopez Pena And R. J. Duro, pp. 654 -3-D Motion System (“Data Gloves”): Application For Parkinson Desease-Y. Su, C.R. Allen, D. Geng, D. Burn, U, Brechany, G. D. Bell, And R. Rowland, pp. 62 -A Fuzzy Linguistic-Based Software Tool For Seismic Image Interpretation-L. Valet, G. Mauris, P. Bolon, And N. K…
-Guest Editorial-B. P. Gollomp And I. Golecki, pp. -Dynamic Strain Measurement Using An Extrinsic Fabry-Perot Interferometric Sensor And An Arrayed Waveguide Grating Devices-A. J. Willshire, P. Niewcasz, L. Dziuda, G. Fusiek, And J.R. Mcdonald,pp. 4 -A Novel Fiber-Optic Pressure Sensor Operated At 1300-Nm Wavelength-J. Chen And W. J. Bock, p. 10 -Measurement And System Impact Of Multipath I…
-Guest Editorial-G. Jones, pp. 476 -Foreword-S. Pollit, pp. 478 -Ac Power Measurements; Callibration System For Electronic Instrument Transformers With Digital Output-B.Djokic And E. So, pp. 479 -Precision Measurement Of Power Harmonics And Flickers-I. Budovski And G. Hammond, pp. 483 -A Wavelet-Based Method Of Measuring Fluctuating Harmonics For Determining The Filter Time Constant Of IEC …
-Special Section On The Intelligent Data Acquisition And Advanced Computer Systems( IDAACS) Workshop-V. Haasz And A. Sachencko, pp. 3 -Time-Of-Flight Measurement Of Ultrasonic Pulse Echoes Using Wavelet Networks-D. Grimaldi, pp. 5 -Improving Sensitivity And Selectivity Of Sno2 Gas Sensors By Temperature Variation-J. Zakrzewski, W. Domanski, P. Chaitas And T. Laopulos, pp. 14 -Methodology Of …
-Guest Editorial-U. Feller, pp. 225 -Optical Frequency Standards And Measurement-J. L. Hall, And J. Ye, pp. 227 -The BIPM Laser Standards At 663 Nm And 532 Nm Simultaneously Linked To The SI Second Using A Femtosecond Laser In In An Optical Clock Configurations- L.-S. Ma, L. Robertsson, S. Picard, J.-M. Chartier, H. Karlsson, E. Prieto, And R.S. Windeller, pp.32 -Results From International …
-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…