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Ditemukan 3 dari pencarian Anda melalui kata kunci: author="E. M. Petriu"
cover
IEEE Transactions On Instrumentation And Measurement: A Publication Of The …
Komentar Bagikan
F. LombardiL. SchianoR. RajsumanM. SahinogluS. R. DasC. V RamamoorthyM. H. Assaf E. M. PetriuW-B. JoneN. MasudaK. YamashitaW. R. EisenstadtR. M. FoxT. ZhangV. NarayananX. XiongY-L. WuA. LaknaurH. HashempourF. J. MeyerJ. M. CazeauxM. OmañaC. MetraC. V. RamamoorthyR. RosalesT. FarahmandS. TabatabaeiA. Ivanov

-First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 1559 -Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence characterization-S. R. Das, C. V Ramamoorthy, M. H. Assaf E. M. Petriu, W-B. Jone, and M. Sahinoglu, …

Edisi
Vol.54, No.5, October 2005
ISBN/ISSN
0018-9359
Deskripsi Fisik
pp. 1659-2129, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i c.1
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
S. MouradFak. HukumE. M. PetriuS.R. DasR. RajsumanK. ChakabartyM. SeuringM. SudarmaM.H. AssafW.-B. JoneM. SahinogluD.C. HuangP.K. LalaA. L. BurresS.L. LinS. KrishnanJ. SavirZ. GuoA.M. ShethS.F.-C. TsengW.T.-K. ChienE. GongB.-C CaiS. BaglioL. AntoniR. LeveugleB. FeherS.Y.C. CatundaJ.-F. NavinerG. S. DeepR.C.S. FreireS. Abou ChahineB. HuyartJ. AchkarS. Chen,D.-Y. JengH. HadanoY. IshiguroM. NayakamaK. WatanabeT. Chiu

-Guest Editorial-S.R. Das And R. Rajsuman, pp. 1350 -Space Compaction Of Test Responses Using Orthogonal Transmission Functions- K. Chakabarty And M. Seuring, pp. 1353 -Parity Bit Signature In Response Data Compaction And Built-In Self-Testing Of VLSI Circuits With Nonexhaustive Test Sets-S.R. Das, M. Sudarma, M.H. Assaf, E. M. Petriu, W.-B. Jone, K. Chakrabarty, And M. Sahinoglu, pp. 1363 …

Edisi
VOL.52, NO.5, OCTOBER 2003
ISBN/ISSN
0018-9456
Deskripsi Fisik
1350-1692 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
R. Z. MorawskiV.D. DesnicaLj. D. ZivanovO. S. AleksicM. LukovicM.D.NimrihterN. DedeneR. PintelonP. LataireA.H. TanK.R. GodfreyS.O. NelsonP. G. Bartley, JrY. -W. Chen, N.E. MendozaZ. NakaoT. AdachiR. ArseneauM.E. SutherlandJ.J. ZelleM. NiemannV. HansR. StormK. KolahiH. RockS. Van AertA. J. Den DekkerA. Van Den BosD. Van DyckC. BergerJ. Lim, Q. YangB.E. JonesP.R. JacksonL. CallegaroG.C. BoscoP.P. CapraD. SerazioV.D’ EliaU. PoglianoM.D. CordeaD.C. PetriuE. M. PetriuN.D. GeorganasT. E. WhalenM. DemereyeE. Dereine, C. EugeneV. Naydenov

-Guest Editorial-R. Z. Morawski, pp. 567 -List Of Reviewers-R. Z. Morawski, pp. 568 -Comparative Characteristic Of Thick-Film Integrated LC Filters-V.D. Desnica, Lj. D. Zivanov, O. S. Aleksic, M. Lukovic, And M.D.Nimrihter, pp. 570 -Measurement Of Multivariable Frequency Response Functions In The Presence Of Nonlinear Distortion—Some Practical Aspect-N. Dedene,R. Pintelon, And P. Lataire…

Edisi
VOL.51, NO.4, AUGUST 2002
ISBN/ISSN
0018-9456
Deskripsi Fisik
567-881 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i