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Ditemukan 3 dari pencarian Anda melalui kata kunci: author=R. Rajsuman
cover
IEEE Transactions On Instrumentation And Measurement: A Publication Of The …
Komentar Bagikan
F. LombardiL. SchianoR. RajsumanM. SahinogluS. R. DasC. V RamamoorthyM. H. Assaf E. M. PetriuW-B. JoneN. MasudaK. YamashitaW. R. EisenstadtR. M. FoxT. ZhangV. NarayananX. XiongY-L. WuA. LaknaurH. HashempourF. J. MeyerJ. M. CazeauxM. OmañaC. MetraC. V. RamamoorthyR. RosalesT. FarahmandS. TabatabaeiA. Ivanov

-First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 1559 -Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence characterization-S. R. Das, C. V Ramamoorthy, M. H. Assaf E. M. Petriu, W-B. Jone, and M. Sahinoglu, …

Edisi
Vol.54, No.5, October 2005
ISBN/ISSN
0018-9359
Deskripsi Fisik
pp. 1659-2129, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i c.1
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
J. DiH. LiR. RajsumanR. Schiano Lo MorielloA. CarulloM. ParvisA. VallanR. Tittotol. BenetazzoA. BaccigalupiS. R. DasJ.-Y RyuB. C. KimI. SyllaY. HanX LiA. ChandraM.-K. ChenC-C. TaiY.-J HuangD. P VasudevanP .K. LalaJ. P. ParkersonR. X. GaoZ. FanC. Affolderbach, F DrozG. MiletiE. Angelini, F FerrarisV. GalloneS. GrassiniL. Angrisani,P A. PegoraroW. J. BurgerG. CrupiN. Donato

-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…

Edisi
VOL.55, NO.2, APRIL 2006
ISBN/ISSN
0018-9456
Deskripsi Fisik
378-688 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
S. MouradFak. HukumE. M. PetriuS.R. DasR. RajsumanK. ChakabartyM. SeuringM. SudarmaM.H. AssafW.-B. JoneM. SahinogluD.C. HuangP.K. LalaA. L. BurresS.L. LinS. KrishnanJ. SavirZ. GuoA.M. ShethS.F.-C. TsengW.T.-K. ChienE. GongB.-C CaiS. BaglioL. AntoniR. LeveugleB. FeherS.Y.C. CatundaJ.-F. NavinerG. S. DeepR.C.S. FreireS. Abou ChahineB. HuyartJ. AchkarS. Chen,D.-Y. JengH. HadanoY. IshiguroM. NayakamaK. WatanabeT. Chiu

-Guest Editorial-S.R. Das And R. Rajsuman, pp. 1350 -Space Compaction Of Test Responses Using Orthogonal Transmission Functions- K. Chakabarty And M. Seuring, pp. 1353 -Parity Bit Signature In Response Data Compaction And Built-In Self-Testing Of VLSI Circuits With Nonexhaustive Test Sets-S.R. Das, M. Sudarma, M.H. Assaf, E. M. Petriu, W.-B. Jone, K. Chakrabarty, And M. Sahinoglu, pp. 1363 …

Edisi
VOL.52, NO.5, OCTOBER 2003
ISBN/ISSN
0018-9456
Deskripsi Fisik
1350-1692 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i