-First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 1559 -Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence characterization-S. R. Das, C. V Ramamoorthy, M. H. Assaf E. M. Petriu, W-B. Jone, and M. Sahinoglu, …
-Guest Editorial-N. Park And F. Lombardi, pp. 1694 -Special Selection Papers: An Embryonic Approach To Reliable Digital Instrumentation Based On Evolvable Hardware-V. Sahni And V.P. Pyara, pp. 1696 -The Design Of Reliable Devices For Mission-Critical Applications-C. Bolchini, L. Pomante, F. Salice, And D. Scuito, pp. 1703 -Modeling And Analysis Of Soft -Test/Repair For CCD-Based Digital X-Ra…
-Indirect Measurement Within Dynamical Context: Probabilistic Approach To Deal With Uncertainly -H. Baili And G.A Fleury, pp. 1449 -Integration Of Dependability In A Task Allocation Problem- F. Bicking, B. Conrard, And J.-M. Thiriet, pp.1445 -Evaluating The Repaor Of System-On-Cjip(SoC) Using Connectivity-M. Choi, N. Park, V. Piuri, And F. Lombardi, pp.1464 -A Tunable Split Resonator Method …