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IEEE Transactions On Instrumentation And Measurement: A Publication Of The …
-Study of Micromanipulation Using Stereoscopic Microscope- H. Yamamoto and T. Sano, pp. 182 -Flatness Measurement System Based on a NonLinear Optical Triangulation Technique- D. F Garcia, M. Garcia, F. Obeso, and V. Fernandez, pp. 188 -Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Networks- M. Catelani a…
- Edisi
- Vol.51, No.2, April 2002
- ISBN/ISSN
- 0018-9359
- Deskripsi Fisik
- pp. 182-398, ill; 30cm
- Judul Seri
- -
- No. Panggil
- REF 620 TIM i c.1
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