-Guest Editorial- R. F Wolffenbuttel and C. J. van Mullen, pp. 1467 -The Relationship Between Microsystem Technology and Metrology-R. F Wolffenbuttel and C J. van Mullen, pp. 1469 -IC Fabrication Compatible Processing for Insirumentation and Measurement Applications-D.D. L. Wijngaards and R F Wolfenbuttel, pp. 1475 -Development of Thin-Film Multijunction Thermal Converters at PTB/IPHT-M. Klo…