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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.53, NO.6, DECEMBER 2004.
-Indirect Measurement Within Dynamical Context: Probabilistic Approach To Deal With Uncertainly -H. Baili And G.A Fleury, pp. 1449
-Integration Of Dependability In A Task Allocation Problem- F. Bicking, B. Conrard, And J.-M. Thiriet, pp.1445
-Evaluating The Repaor Of System-On-Cjip(SoC) Using Connectivity-M. Choi, N. Park, V. Piuri, And F. Lombardi, pp.1464
-A Tunable Split Resonator Method For Nondescructive Permittivity Characterization-X. Fang, D. Linton, C. Walker, And B. Collins, pp.1473
-Detective Quantum Efficiency[DQE(0)] Of CZT Semiconductor Detectors For Digital Radiography-G.C. Giacos, S. Suryanarayanan, R. Guntupali, J. Odogba, N.Shah, S. Vedanthan, S. Chowdhury, K. Mehta, S. Sumrain, N. Patnekar, A. Moholkar, V. Kumar, And R.E. Endorf, pp. 1479
-Didital Calibration For Monotonic Pipelined A/D Converters-J. Guo, W. Law, W.J. Helms, And D.J. Allstot, pp.1485
-Moisture Determination In Single Peanut Pods By Complex RF Impedance Measurement-C.V.K. Kandala, pp.1493
-Sensor Technology Advanced And Future Trends-O. Kanoun And H.-R. Trankler, pp. 1497
-A Novel, Compact, Low Cost, Impulse Ground-Penetrating Radar For Nondescructive Evaluation Of Pavements-J.S. Lee, C. Nguyen, And T. Scullion, pp. 1502
-On-Chip Rise-Time Measurements-S.L. Lin And S. Mourad, pp. 1510
-PCA-Based Feature Selection Scheme For Machine Defect Classification-A. Malhi And R.X. Gao, pp. 1517
-A System For High-Resolution, Nondescructive, Ultrasonic Imaging Of Weld Grains-G.J. Schuster, S.R. Doctor, And L.J. Bond,pp.1526
-A Near-Field-Sensing Transceiver For Intrabody Communication Based On The Electrooptic Effect-M. Shinagawa, M. Fukutomo, K. Ochiai And H. Kyuragi, pp.1533
-A Wavelet-Based Multisensory Data Fusion Algotithm-L. Xu, J.Q. Zhang And Y. Yan, pp.1539
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