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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.52, NO.6, DECEMBER 2003

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-Guest Editorial-N. Park And F. Lombardi, pp. 1694
-Special Selection Papers: An Embryonic Approach To Reliable Digital Instrumentation Based On Evolvable Hardware-V. Sahni And V.P. Pyara, pp. 1696
-The Design Of Reliable Devices For Mission-Critical Applications-C. Bolchini, L. Pomante, F. Salice, And D. Scuito, pp. 1703
-Modeling And Analysis Of Soft -Test/Repair For CCD-Based Digital X-Ray Systems-B. Jin, N. Park, K.M. George, M. Choi, And M. Yeary, pp. 1713
-Self-Checking Design, Implementation, And Merasurement Of A Controller For Track-Side Railway Systems-L. Schiano, C. Metrta, And D. Marino, pp. 1722
-Spare: Selective Partial Replication For Concurrent Fault-Detection In FSMs-P. Drineas And Y. Makris, pp.1729
-Time-To Voltage Converter For On-Chip Jitter Measurement-T. Xia And J.-C. Lo, pp. 1738
-Analysis And Measurement Of Timing Jitter Induced By Radiated EMI Noise In Automativc Test Equipment-Y.J. Lee. T. Kane, J.-J. Lim, L. Schiano, Y.-B. Kim, F.J. Meyer, F. Lombardi, And S. Max, pp. 1749
-A Versatile Builtb-In Cmos Sensing Device For Digital Circuit Parametric Test- M.S. Dragic And M. Margala, pp. 1756

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Ketersediaan

Informasi Detail

Judul Seri

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No. Panggil

REF 620 TIM i

Penerbit

USA : THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc., 2003

Deskripsi Fisik

1694-1902 hlm, ill; 30cm

Bahasa

English

ISBN/ISSN

0018-9456

Klasifikasi

620

Tipe Isi

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Tipe Media

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Tipe Pembawa

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Edisi

VOL.52, NO.6, DECEMBER 2003

Subjek

An Embryonic
Reliable Digital Instrumentation
The Design Devices
Mission-Critical Applications
Modeling And Analysis Of Soft -Test/Repair
CCD-Based Digital X-Ray Systems
Self-Checking Design
Merasurement Of A Controller
Selective Partial Replication
Concurrent Fault-Detection In FSMS
Time-To Voltage Converter
On-Chip Jitter Measurement
Analysis And Measurement
Timing Jitter Induced
Versatile Built-In CMOS Sensing Device

Info Detail Spesifik

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Pernyataan Tanggungjawab

THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY

Versi lain/terkait

Lampiran Berkas

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