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IEEE Transactions On Instrumentation And Measurement: A Publication Of The Ieee Instrumentation And Measurement Society, Vol.51, No.3, June 2002

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-Study of Micromanipulation Using Stereoscopic Microscope- H. Yamamoto and T. Sano, pp. 182
-Flatness Measurement System Based on a NonLinear Optical Triangulation Technique- D. F Garcia, M. Garcia, F. Obeso, and V. Fernandez, pp. 188
-Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Networks- M. Catelani and A. Fort, pp. 198

-Flexible Sampling Frame Measurement System-.O. Bazylevych, O. Ivakhiv, and S. P. Yatsyshyn, pp. 203
-Computerized Investigation of Robust Measurement Systems- N. P. Kolev, S. T Yordanova, and P. M. Tzvetkov, pp. 207
-Automatic Spectral Analysis With Time Series Models- P.M. T Broersen, pp. 211
-SVD-Based Complexity Reduction of Rule-Bases With Nonlinear Antecedent Fuzzy Sets- O. Takács and A. R. Várkonyi-Kóczy, pp. 217
-Adaptation of SVD-Based Fuzzy Reduction via Minimal Expansion- P. Baranyi and A. R. Várkonyi-Kóczy, pp. 222
-Comparison of Analog Continuum Correlators for Remote Sensing and Radio Astronomy-O. Koistinen, J. Lahtinen, and M. T. Hallikainen, pp. 227
-An Approach for Fault Detection and Isolation in Dynamic Systems From Distributed Measurements-E.-J. Manders, L. A. Barford, and G. Biswas, pp. 235
-Characterization of an Eddy-Current-Based System for Nondestructive Testing- A. Bernieri, G. Betta, and L. Ferrigno, pp. 241
-Implementation of a Bandwidth Allocation Scheme in a Token-Passing Fieldbus Network- S. H. Hong and Y. C. Kim, pp. 246
-A Novel Frequency Discriminated Phase Controller for High-Speed Optical Clocks Generated From Laser Diodes-G.-R. Lin, pp. 252
-Adaptive IIR Filter Design for Single Sensor Applications- M. B. Yeary and N. C. Griswold, pp. 259
-Deconvolution From Instrumental Devices and Source Effect in Acoustic Experiments-H.-P Valero, S. Gautier, G. Saracco, and M. Holschneider, pp. 268
-Multisource Classification Using ICM and Dempster-Shafer Theory.-S. Foucher, M. Germain, J.-M. Boucher, and G. B. Bénié, pp. 277
-Electro-Optic Sensor for Measurement of DC Fields in the Presence of Space Charge- Cecelja, M. Bordovsky, and W. Balachandran, pp. 282
-Weighted Multipoint Interpolated DFT to Improve Amplitude Estimation of Multifrequency Signal- D. Agrez, pp. 287
-Head-Media Interface Instability Under Hostile Operating Conditions-G. Tunstall, W. Clegg. D. F. L. Jenkins, and C. Chilumbu, pp. 293
-A Review of Stochastic Resonance: Circuits and Measurement-G. P. Harmer, B. R. Davis, and D, Abbott, pp. 299
-Compensation of Impedance Meters When Using an External Front-End Amplifier-J. M. Torrents and R. Pallàs-Areny, pp. 310
-A CNN-Based Passive Optical Range Finder for Real-Time Robotic Applications-N. Giaquinto, M. Savino, and S. Taraglio, pp. 314

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Ketersediaan

Informasi Detail

Judul Seri

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No. Panggil

REF 620 TIM i

Penerbit

USA : THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc.., 2002

Deskripsi Fisik

182-398 hlm, ill; 30cm

Bahasa

English

ISBN/ISSN

0018-9456

Klasifikasi

620

Tipe Isi

-

Tipe Media

-

Tipe Pembawa

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Edisi

Vol.51, No.3, June 2002

Subjek

Fak. Hukum
Micromanipulation Using Stereoscopic Microscope
Flatness Measurement System
Soft Fault Detection and Isolation in Analog
Flexible Sampling Frame Measurement System
Computerized Investigation of Robust
Automatic Spectral Analysis
Based Complexity Reduction of Rule
SVD-Based Fuzzy Reduction via Minimal Expansion
Comparison of Analog Continuum Correlators
An Approach for Fault Detection and Isolation in D
Characterization of an Eddy
Implementation of a Bandwidth Allocation Scheme
Novel Frequency Discriminated Phase Controller for
ICM and Dempster-Shafer Theory
Electro-Optic Sensor for Measurement
Weighted Multipoint Interpolated DFT
Improve Amplitude Estimation
Head-Media Interface Instability
Review of Stochastic Resonance: Circuits and Measu
Compensation of Impedance Meters
CNN-Based Passive Optical Range Finder for Real

Info Detail Spesifik

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Pernyataan Tanggungjawab

THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY

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