-Study of Micromanipulation Using Stereoscopic Microscope- H. Yamamoto and T. Sano, pp. 182 -Flatness Measurement System Based on a NonLinear Optical Triangulation Technique- D. F Garcia, M. Garcia, F. Obeso, and V. Fernandez, pp. 188 -Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Networks- M. Catelani a…
-Study of Micromanipulation Using Stereoscopic Microscope- H. Yamamoto and T. Sano, pp. 182 -Flatness Measurement System Based on a NonLinear Optical Triangulation Technique- D. F Garcia, M. Garcia, F. Obeso, and V. Fernandez, pp. 188 -Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Networks- M. Catelani a…
-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…