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IEEE Transactions On Instrumentation And Measurement: A Publication Of The IEEE Instrumentation And Measurement Society, Vol.51, No.2, April 2002

O. Koistinen - Nama Orang; S. Taraglio - Nama Orang; M. Savino, - Nama Orang; N. Giaquinto - Nama Orang; R. Pallàs-Areny - Nama Orang; J. M. Torrents - Nama Orang; B. R. Davis - Nama Orang; C. Chilumbu - Nama Orang; D. Agrez - Nama Orang; W. Balachandran - Nama Orang; G. B. Bénié - Nama Orang; M. Holschneider - Nama Orang; G.-R. Lin - Nama Orang; S. H. Hong - Nama Orang; A. Bernieri - Nama Orang; H. Yamamoto - Nama Orang; A. R. Várkonyi-Kóczy - Nama Orang; P. Baranyi - Nama Orang; O. Takács - Nama Orang; P.M. T Broersen - Nama Orang; S. T Yordanova - Nama Orang; N. P. Kolev - Nama Orang; S. P. Yatsyshyn - Nama Orang; O. Ivakhiv - Nama Orang; O. Bazylevych - Nama Orang; M. Catelani - Nama Orang; F. Obeso - Nama Orang; D. F Garcia - Nama Orang; T. Sano - Nama Orang;

-Study of Micromanipulation Using Stereoscopic Microscope- H. Yamamoto and T. Sano, pp. 182
-Flatness Measurement System Based on a NonLinear Optical Triangulation Technique- D. F Garcia, M. Garcia, F. Obeso, and V. Fernandez, pp. 188
-Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Networks- M. Catelani and A. Fort, pp. 198

-Flexible Sampling Frame Measurement System-.O. Bazylevych, O. Ivakhiv, and S. P. Yatsyshyn, pp. 203
-Computerized Investigation of Robust Measurement Systems- N. P. Kolev, S. T Yordanova, and P. M. Tzvetkov, pp. 207
-Automatic Spectral Analysis With Time Series Models- P.M. T Broersen, pp. 211
-SVD-Based Complexity Reduction of Rule-Bases With Nonlinear Antecedent Fuzzy Sets- O. Takács and A. R. Várkonyi-Kóczy, pp. 217
-Adaptation of SVD-Based Fuzzy Reduction via Minimal Expansion- P. Baranyi and A. R. Várkonyi-Kóczy, pp. 222
-Comparison of Analog Continuum Correlators for Remote Sensing and Radio Astronomy-O. Koistinen, J. Lahtinen, and M. T. Hallikainen, pp. 227
-An Approach for Fault Detection and Isolation in Dynamic Systems From Distributed Measurements-E.-J. Manders, L. A. Barford, and G. Biswas, pp. 235
-Characterization of an Eddy-Current-Based System for Nondestructive Testing- A. Bernieri, G. Betta, and L. Ferrigno, pp. 241
-Implementation of a Bandwidth Allocation Scheme in a Token-Passing Fieldbus Network- S. H. Hong and Y. C. Kim, pp. 246
-A Novel Frequency Discriminated Phase Controller for High-Speed Optical Clocks Generated From Laser Diodes-G.-R. Lin, pp. 252
-Adaptive IIR Filter Design for Single Sensor Applications- M. B. Yeary and N. C. Griswold, pp. 259
-Deconvolution From Instrumental Devices and Source Effect in Acoustic Experiments-H.-P Valero, S. Gautier, G. Saracco, and M. Holschneider, pp. 268
-Multisource Classification Using ICM and Dempster-Shafer Theory.-S. Foucher, M. Germain, J.-M. Boucher, and G. B. Bénié, pp. 277
-Electro-Optic Sensor for Measurement of DC Fields in the Presence of Space Charge- Cecelja, M. Bordovsky, and W. Balachandran, pp. 282
-Weighted Multipoint Interpolated DFT to Improve Amplitude Estimation of Multifrequency Signal- D. Agrez, pp. 287
-Head-Media Interface Instability Under Hostile Operating Conditions-G. Tunstall, W. Clegg. D. F. L. Jenkins, and C. Chilumbu, pp. 293
-A Review of Stochastic Resonance: Circuits and Measurement-G. P. Harmer, B. R. Davis, and D, Abbott, pp. 299
-Compensation of Impedance Meters When Using an External Front-End Amplifier-J. M. Torrents and R. Pallàs-Areny, pp. 310
-A CNN-Based Passive Optical Range Finder for Real-Time Robotic Applications-N. Giaquinto, M. Savino, and S. Taraglio, pp. 314


Ketersediaan
#
Perpustakaan Pusat UBL (Di Rak Kelas 600) REF 620 TIM i c.1
0015430
Tersedia namun tidak untuk dipinjamkan - Baca di tempat
Informasi Detail
Judul Seri
-
No. Panggil
REF 620 TIM i c.1
Penerbit
USA : IEEE., 2002
Deskripsi Fisik
pp. 182-398, ill; 30cm
Bahasa
English
ISBN/ISSN
0018-9359
Klasifikasi
620
Tipe Isi
-
Tipe Media
-
Tipe Pembawa
-
Edisi
Vol.51, No.2, April 2002
Subjek
Remote Sensing
Micromanipulation
Stereoscopic Microscope
NonLinear Optical Triangulation
Soft Fault Detection
Flexible Sampling Frame
Robust Measurement Systems
Time Series Models
Rule-Bases
Nonlinear Antecedent Fuzzy
SVD-Based Fuzzy
Minimal Expansion
Analog Continuum
Eddy-Current-Based
Token-Passing
Info Detail Spesifik
-
Pernyataan Tanggungjawab
A Publication Of The IEEE Instrumentation And Measurement Society
Versi lain/terkait

Tidak tersedia versi lain

Lampiran Berkas
Tidak Ada Data
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