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IEEE Transactions On Instrumentation And Measurement: A Publication Of The …
-Study of Micromanipulation Using Stereoscopic Microscope- H. Yamamoto and T. Sano, pp. 182 -Flatness Measurement System Based on a NonLinear Optical Triangulation Technique- D. F Garcia, M. Garcia, F. Obeso, and V. Fernandez, pp. 188 -Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Networks- M. Catelani a…
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- Vol.51, No.3, June 2002
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- 0018-9456
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- 182-398 hlm, ill; 30cm
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- REF 620 TIM i
IEEE Transactions On Instrumentation And Measurement: A Publication Of The …
-First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 1559 -Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence characterization-S. R. Das, C. V Ramamoorthy, M. H. Assaf E. M. Petriu, W-B. Jone, and M. Sahinoglu, …
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- Vol.54, No.5, October 2005
- ISBN/ISSN
- 0018-9359
- Deskripsi Fisik
- pp. 1659-2129, ill; 30cm
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- REF 620 TIM i c.1
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…
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- VOL.55, NO.2, APRIL 2006
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 378-688 hlm, ill; 30cm
- Judul Seri
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- REF 620 TIM i
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
-New Digital Signal-Processing Approach for Transmitter Measurements in Third Generation Telecommunications Systems-L. Angrisani, M. D'Apuzzo, and M. D'Arco, pp. 622 -Neuro-Fuzzy TSK Network for Calibration of Semiconductor Sensor Array for Gas Measurements-S. Osowski, T. H. Linh, and K. Brudzewski, pp. 630 -Neuro-Fuzzy Network for Flavor Recognition and Classification-S. Osowski, T. H. Linh,…
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- VOL.53, NO.3, JUNE 2004
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 622-880 hlm, ill; 30cm
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- REF 620 TIM i
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
-Guest Editorial-Ottoboni and S. Demidenko, pp. 1346 -With Leakage Minimization-D.Agrez, pp. 1347 -Digital Processing of Dual-Frequency Servo Burst in Hard Disk Drives- A. Al Mun. G. Guo, K. C. Tan, And Y.Liu, pp. 1354 -A Digital Tachometer for High-Temperature Telemetry Utilizing uprated Commercial Electronic Components- D. Ambrush, V. Bilas, And D. Vasic, pp. 1361 -Effects of Driving Mod…
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- VOL.54, NO.4, AUGUST 2005
- ISBN/ISSN
- 0018-9456
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- 1346-1654 hlm, ill; 30cm
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- No. Panggil
- REF 620 TIM i
: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
-Guest Editorial-B. P. Gollomp And I. Golecki, pp. -Dynamic Strain Measurement Using An Extrinsic Fabry-Perot Interferometric Sensor And An Arrayed Waveguide Grating Devices-A. J. Willshire, P. Niewcasz, L. Dziuda, G. Fusiek, And J.R. Mcdonald,pp. 4 -A Novel Fiber-Optic Pressure Sensor Operated At 1300-Nm Wavelength-J. Chen And W. J. Bock, p. 10 -Measurement And System Impact Of Multipath I…
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- VOL.53, NO.1, FEBRUARY 2004
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 4-232 hlm, ill; 30cm
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- REF 620 TIM i
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
-Guest Editorial-G. Jones, pp. 476 -Foreword-S. Pollit, pp. 478 -Ac Power Measurements; Callibration System For Electronic Instrument Transformers With Digital Output-B.Djokic And E. So, pp. 479 -Precision Measurement Of Power Harmonics And Flickers-I. Budovski And G. Hammond, pp. 483 -A Wavelet-Based Method Of Measuring Fluctuating Harmonics For Determining The Filter Time Constant Of IEC …
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- VOL.54, NO.2, APRIL 2005
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 476-936 hlm, ill; 30cm
- Judul Seri
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- No. Panggil
- REF 620 TIM i
: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…
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- VOL.54, NO.3, JUNE 2005
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 939-1342 hlm, ill; 30cm
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- REF 620 TIM i
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
-Guest Editorial-S.R. Das And R. Rajsuman, pp. 1350 -Space Compaction Of Test Responses Using Orthogonal Transmission Functions- K. Chakabarty And M. Seuring, pp. 1353 -Parity Bit Signature In Response Data Compaction And Built-In Self-Testing Of VLSI Circuits With Nonexhaustive Test Sets-S.R. Das, M. Sudarma, M.H. Assaf, E. M. Petriu, W.-B. Jone, K. Chakrabarty, And M. Sahinoglu, pp. 1363 …
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- VOL.52, NO.5, OCTOBER 2003
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 1350-1692 hlm, ill; 30cm
- Judul Seri
- -
- No. Panggil
- REF 620 TIM i
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
-Guest Editorial-R. Z. Morawski, pp. 567 -List Of Reviewers-R. Z. Morawski, pp. 568 -Comparative Characteristic Of Thick-Film Integrated LC Filters-V.D. Desnica, Lj. D. Zivanov, O. S. Aleksic, M. Lukovic, And M.D.Nimrihter, pp. 570 -Measurement Of Multivariable Frequency Response Functions In The Presence Of Nonlinear Distortion—Some Practical Aspect-N. Dedene,R. Pintelon, And P. Lataire…
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- VOL.51, NO.4, AUGUST 2002
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 567-881 hlm, ill; 30cm
- Judul Seri
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- No. Panggil
- REF 620 TIM i
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