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: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…
- Edisi
- VOL.54, NO.3, JUNE 2005
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 939-1342 hlm, ill; 30cm
- Judul Seri
- -
- No. Panggil
- REF 620 TIM i
IEEE Transaction on Education : A Publication of the IEEE Education Society, …
IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 53 Number 1, February 2010 contains of: - Bridging physics to electronics-an outreach effort - K.K. Tan, K. -Z. Tang, V.Ng, pp. 3 - The implementation and evaluation of a university-based outreach laboratory program in electrical engineering - C. R. Smaill, pp. 12 - An electrical engineering summer academy fo…
- Edisi
- Volume 53 Number 1, February 2010
- ISBN/ISSN
- 0018-9359
- Deskripsi Fisik
- pp. 1-71
- Judul Seri
- -
- No. Panggil
- REF 620 TIM i c.1
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