-Guest Editorial-S.R. Das And R. Rajsuman, pp. 1350 -Space Compaction Of Test Responses Using Orthogonal Transmission Functions- K. Chakabarty And M. Seuring, pp. 1353 -Parity Bit Signature In Response Data Compaction And Built-In Self-Testing Of VLSI Circuits With Nonexhaustive Test Sets-S.R. Das, M. Sudarma, M.H. Assaf, E. M. Petriu, W.-B. Jone, K. Chakrabarty, And M. Sahinoglu, pp. 1363 …
IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 53 Number 2, May 2010 contains of: - A Project-based laboratory for learning embedded system design with industri support - C.-S. Lee, pp. 173 - Applying peer reviews in software engineering education: an experiment and lessons learned - . Garousi, pp. 182 - A 10-year mechatronics curriculum development initi…