TEXT

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.52, NO.5, OCTOBER 2003.

---

-Guest Editorial-S.R. Das And R. Rajsuman, pp. 1350
-Space Compaction Of Test Responses Using Orthogonal Transmission Functions- K. Chakabarty And M. Seuring, pp. 1353
-Parity Bit Signature In Response Data Compaction And Built-In Self-Testing Of VLSI Circuits With Nonexhaustive Test Sets-S.R. Das, M. Sudarma, M.H. Assaf, E. M. Petriu, W.-B. Jone, K. Chakrabarty, And M. Sahinoglu, pp. 1363
-An Efficient Bist Method For Non-Traditional Faults Of Embedded Memory Arrays-W.B. Jone, D.C. Huang, And S.R. Das, pp. 1381
-Self-Checking Logic Design For FPGA Implementation-P.K. Lala And A. L. Burres, pp. 1391
-A Self-Binning Bist Structure For Data Communications Tranceivers-S.L. Lin, S. Krishnan, And S. Mourad, pp. 1399
-Architecture, Design, And Application Of An Event-Based Test System-R. Rajsuman, pp. 1408
-An Empirical Bayesian Stopping Rule In Testing And Verification Of Behavioral Models-M. Sahinoglu, pp. 1428
-Test Limitations Of Parametric Faults In Analog Circuits-J. Savir And Z. Guo, pp. 1444
-Single Clock, Single-Latch, Scan Design-A.M. Sheth And J. Savir, pp. 1455
-A Cost-Effective Wafer-Level Reliability Test System For Integrated Circuits Maker-S.F.-C. Tseng, W.T.-K. Chien, E. Gong, And B.-C Cai, pp. 1458
-Using Run Time Reconfiguration For Fault Injection Applications-L. Antoni, R. Leveugle, And B. Feher, pp. 1468
-Bio-Geochemically Inspired Capacitive Sensor For Heavy Metals Pollution Monitoring-S. Baglio, pp.1474
-Designing A Programmable Analog Signal Conditioning Circuit Without Loss Of Measurements Range-S.Y.C. Catunda, J.-F. Naviner, G. S. Deep, And R.C.S. Freire, pp. 1482
-Reflectometer Calibration Without An Open Circuits-S. Abou Chahine, B. Huyart, And J. Achkar, pp. 1488
-A Nasicon Co2 Gas Sensor With Drift-Detection Electrode-S. Chen, D.-Y. Jeng, H. Hadano, Y. Ishiguro, M. Nayakama, And K. Watanabe, pp. 1494
-Dielectric Constant Measurement Technique For A Dielectric Strip Using A Rectangular Waveguide-T. Chiu, pp. 1501

---

Ketersediaan

Informasi Detail

Judul Seri

-

No. Panggil

REF 620 TIM i

Penerbit

USA : THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc.., 2003

Deskripsi Fisik

1350-1692 hlm, ill; 30cm

Bahasa

English

ISBN/ISSN

0018-9456

Klasifikasi

620

Tipe Isi

-

Tipe Media

-

Tipe Pembawa

-

Edisi

VOL.52, NO.5, OCTOBER 2003

Subjek

Architecture
Space Compaction
Test Responses
Parity Bit Signature
Response Data Compaction
An Efficient Bist Method
Non-Traditional Faults
Self-Checking Logic Design
FPGA Implementation
A Self-Binning Bist Structure
Data Communications Tranceivers
Design, And Application Of An Event-Based Test Sys
An Empirical Bayesian Stopping Rule,
Test Limitations Of Parametric Faults
Single Clock
Single-Latch
A Cost-Effective Wafer-Level Reliability Test Syst
Integrated Circuits Maker
Heavy Metals Pollution Monitoring
Designing A Programmable Analog Signal Conditionin
Loss Of Measurements Range
Reflectometer Calibration
Open Circuits
A Nasicon Co2 Gas Sensor
Drift-Detection Electrode
Dielectric Constant Measurement Technique
Dielectric Strip

Info Detail Spesifik

-

Pernyataan Tanggungjawab

THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY

Versi lain/terkait

Lampiran Berkas

Komentar

---

Anda harus masuk sebelum memberikan komentar