-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…
-Guest Editorial-S.R. Das And R. Rajsuman, pp. 1350 -Space Compaction Of Test Responses Using Orthogonal Transmission Functions- K. Chakabarty And M. Seuring, pp. 1353 -Parity Bit Signature In Response Data Compaction And Built-In Self-Testing Of VLSI Circuits With Nonexhaustive Test Sets-S.R. Das, M. Sudarma, M.H. Assaf, E. M. Petriu, W.-B. Jone, K. Chakrabarty, And M. Sahinoglu, pp. 1363 …
-Guest Editorial, 22nd IEEE Instrumentation And Measurement Technology Conference-R.A Goubran And V.Z. Groza, pp. 1023 -Special Issue Papers, Security Monitoring Using Microphone Arrays And Audio Classification-A.R. Abu-El-Quran, R. A. Goubran, And A. D. C. Chan, pp. 1025 -High-Resolution Absorption Coefficient And Refractive Index Spectra Of Carbon Monoxide Gas At Milimeter And Submilimeter …
-Guest Editorial-R. Zoughi, pp. 887 -An Accoustic Method For Soil Moisture Measurement-F. Adamo, G.Andria, F. Attivismo, And Y. Wang, pp. 891 -Assesment Of Random And Systematic Errors In Milimeter-Wave Dielectric Measurement Using Open Resonator And Fourier Transform Spectroscopy Systems-M. N. Afsar, A. Moonshiram, And Y. Wang, pp. 899 -Performance Of Data Acquisition Systems From The Userâ…