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: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY, VOL.54, NO.3, JUNE 2005.

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-Guest Editorial-R.X. Gao, pp. 939
-Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941
-Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956
-Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965
-Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Measurement-K.A. Taylor, B. Nelson, A. Chong, H. Lin, E. Chan, M. Soma, H. Haggag, J. Huard, And J. Braatz, pp. 975
-A Built-In-Test Scheme For Evaluating The Parameters Of Floating-Gate Mos Transistors-A.S. Hou, pp.988
-Built-In Self-Test For Phase-Locked Loops-C.-L. Hsu, Y. Lai, And S.-W. Wang, pp.996
-A Bayesian Approach To Diagnosis And Prognosis Using Built-In-Test-J.W. Sheppard And M.A. Kaufman, pp.1003
-Effective Simulation Of Signals For Testing ECG Analyzer-A. Josko And R.J. Rak, pp. 1019
-A Chirp-Z Transform-Based Synchronizer For Power System Measurements-M. Aiello, A. Cataliotti, And S. Nuccio, pp. 1025
-Automated Selection Of Test Frequencies For Fault Diagnosis In Analog Electronic Circuits-C. Alippi, M. Catelani, A. Fort, And M. Mugnaini, pp.1033
-Characterization Of Threshold-Induced Phenomena In Deterministic Driven Devices-B. Ando, S. Graziano, And P. Pitrone, pp. 1045

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Ketersediaan

Informasi Detail

Judul Seri

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No. Panggil

REF 620 TIM i

Penerbit

USA : THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS,Inc.., 2005

Deskripsi Fisik

939-1342 hlm, ill; 30cm

Bahasa

English

ISBN/ISSN

0018-9456

Klasifikasi

620

Tipe Isi

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Tipe Media

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Tipe Pembawa

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Edisi

VOL.54, NO.3, JUNE 2005

Subjek

Getting Errors
Catch Themselves-Self-Testing
VLSI Circuits
Embedded Ttest Control Schemes
iBIST, SOCs
Built In Online And Offline Test
Special Issue On Bit CMOS Built-In Test Architectu
A Built-In-Test Scheme, Evaluating The Parameters
Built-In Self-Test
Phase-Locked Loops
A Bayesian Approach
Diagnosis And Prognosis
Effective Simulation Of Signals
Testing ECG Analyzer
A Chirp-Z Transform-Based Synchronizer
Automated Selection
Test Frequencies
Characterization Of Threshold-Induced Phenomena
Deterministic Driven Devices

Info Detail Spesifik

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Pernyataan Tanggungjawab

THE IEEE INSTRUMENTATION AND MEASUREMENT SOCIETY

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