-Guest Editorial- R. F Wolffenbuttel and C. J. van Mullen, pp. 1467 -The Relationship Between Microsystem Technology and Metrology-R. F Wolffenbuttel and C J. van Mullen, pp. 1469 -IC Fabrication Compatible Processing for Insirumentation and Measurement Applications-D.D. L. Wijngaards and R F Wolfenbuttel, pp. 1475 -Development of Thin-Film Multijunction Thermal Converters at PTB/IPHT-M. Klo…
IEEE Transaction on INSTRUMENTATION AND MEASUREMENT : A Publication of the IEEE Instrumentation and Measurement Society, Volume 51 Number 5, October 2002 contains of: - Measurement of pesticide residues in food based on diffuse reflectance IR spectroscopy - Hiroaki, Toyonori, Eiji, pp. 886 - Slow-wave structures-based method of measurements - Pchelnikov and D.S. Nyce, pp. 891 - Head-Disk Spa…
IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 54 Number 3, August 2011 contains of: - Experiment-based teaching in advanced control engineering - Precup, Radac, Petriu, pp. 345 - Transforming PC power supplies into smart car battery conditioners - Rdriguez-Ascariz, pp. 366 - Teaching multimedia data protection through a international online competition -…
Mimbar Hukum - Volume 28, Nomor 2, Juni 2016 berisi: * Konflik Yurisdiksi Dan Penegakan Hukum Kekayaan Intelektual Dalam Rangka Pasar Tunggal - Rahmi Jened, pp. 201-214 * Analisis Yuridis Akad Tabarru’ Dan Akad Tijarah Dalam Produk Unit Link Syariah - Destri Budi Nugraheni, pp. 215-231 * Pengaturan Doktrin Dilusi Merek Sebagai Upaya Perlindungan Hukum Merek Terkenal Di Indonesia - Inge Dw…