-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…
IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 53 Number 3, August 2010 contains of: - integrating asynchronous digital design into the computer engineering curriculum - S.C. Smith, W. K. Al-Assadi, pp. 349 - Educational experiences detecting, using, and representing ternary relationships in database design - D. Cuadra, Iglesias Maqueda, pp. 358 - Amplitu…