-Study of Micromanipulation Using Stereoscopic Microscope- H. Yamamoto and T. Sano, pp. 182 -Flatness Measurement System Based on a NonLinear Optical Triangulation Technique- D. F Garcia, M. Garcia, F. Obeso, and V. Fernandez, pp. 188 -Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Networks- M. Catelani a…
-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…
-New Digital Signal-Processing Approach for Transmitter Measurements in Third Generation Telecommunications Systems-L. Angrisani, M. D'Apuzzo, and M. D'Arco, pp. 622 -Neuro-Fuzzy TSK Network for Calibration of Semiconductor Sensor Array for Gas Measurements-S. Osowski, T. H. Linh, and K. Brudzewski, pp. 630 -Neuro-Fuzzy Network for Flavor Recognition and Classification-S. Osowski, T. H. Linh,…
-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…
-Detection Of Airway Obstructions And Sleep Apnea By Analyzing The Phase Relation Of Respiration Movement Signals-P. Varady, S. Bongar, And Z. Benyo, pp. 2 -Application Of Electrical Capacitance Tomography To The Void Fraction Measurement Of Two-Phase Flow-Z. Huang, B. Wang, And H. Li, pp. 7 -Analysis And Reproduction Of A Signal’s Periodic Components By Means Of An Extended Block-Adaptive …
IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 53 Number 2, May 2010 contains of: - A Project-based laboratory for learning embedded system design with industri support - C.-S. Lee, pp. 173 - Applying peer reviews in software engineering education: an experiment and lessons learned - . Garousi, pp. 182 - A 10-year mechatronics curriculum development initi…