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Ditemukan 6 dari pencarian Anda melalui kata kunci: author=L. Angrisani,
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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
J. DiH. LiR. RajsumanR. Schiano Lo MorielloA. CarulloM. ParvisA. VallanR. Tittotol. BenetazzoA. BaccigalupiS. R. DasJ.-Y RyuB. C. KimI. SyllaY. HanX LiA. ChandraM.-K. ChenC-C. TaiY.-J HuangD. P VasudevanP .K. LalaJ. P. ParkersonR. X. GaoZ. FanC. Affolderbach, F DrozG. MiletiE. Angelini, F FerrarisV. GalloneS. GrassiniL. Angrisani,P A. PegoraroW. J. BurgerG. CrupiN. Donato

-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…

Edisi
VOL.55, NO.2, APRIL 2006
ISBN/ISSN
0018-9456
Deskripsi Fisik
378-688 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
L. AngrisaniW. WinieckiS. RapuanoOttoboniS. DemidenkoD.AgrezA. Al MunG. Guo, K. C. TanY.Liu, S. BaglioV. SaccoA. R. BulsaraM. D'Arco,M. D'Arco, R. S. Lo Morielle, and M. Vadursi, pp. 1374L. Angrisani, M. D’arco, and M. vadursiE. BalestrieriP. DaponteF.A. batziasC. C. SiontorouE. BavaN. BeveriniG. CarelliA. De. MicheleG. GalzrenoE. MaccioniA. Morreti, M. Prevedelli, F. Sorrentino, And C. Sveltop. bilskiP. M. BrisleyG. LuY. YanS. CornwellA. Calderón,A.L. VirtoJ.M. Luque RaigonC.F.M. CarobbiS. LazzeriniL.M. MillantaR. M. CarterE. ColinetJ. Juillard,L. NicuC. BergaudG. Truglia,L. De Vito,

-Guest Editorial-Ottoboni and S. Demidenko, pp. 1346 -With Leakage Minimization-D.Agrez, pp. 1347 -Digital Processing of Dual-Frequency Servo Burst in Hard Disk Drives- A. Al Mun. G. Guo, K. C. Tan, And Y.Liu, pp. 1354 -A Digital Tachometer for High-Temperature Telemetry Utilizing uprated Commercial Electronic Components- D. Ambrush, V. Bilas, And D. Vasic, pp. 1361 -Effects of Driving Mod…

Edisi
VOL.54, NO.4, AUGUST 2005
ISBN/ISSN
0018-9456
Deskripsi Fisik
1346-1654 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
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IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
Teknik Mesin, S. BongarZ. BenyoZ. HuangB. WangH. LiA. RonkL. Angrisani, A. Baccigalupi, And G. D’ AngioloM.G. Cox, M.P. Dainton, N.M. Ridler, M.J. Salter, And P.R. YoungS. Acunto, P. Arpaia, D.M. Hummels, And F.H. IronsT. Sentenac, Y. Le Maoultt, G. Rolland, And M. DevyR. Pintelon, Y. Rolain,And W. Van MoerF.A. Correa AlegriaA.M. Da Cruz SerraG. BucciE. FiorucciC. LandiA. Caddemio And N. DonatoB. Vodros And I. KollarZ. Czaja And R. Zielonko

-Detection Of Airway Obstructions And Sleep Apnea By Analyzing The Phase Relation Of Respiration Movement Signals-P. Varady, S. Bongar, And Z. Benyo, pp. 2 -Application Of Electrical Capacitance Tomography To The Void Fraction Measurement Of Two-Phase Flow-Z. Huang, B. Wang, And H. Li, pp. 7 -Analysis And Reproduction Of A Signal’s Periodic Components By Means Of An Extended Block-Adaptive …

Edisi
VOL.52, NO.1, FEBRUARY 2003
ISBN/ISSN
0018-9456
Deskripsi Fisik
2-215 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
A. Ferrero- S. Salicone And TinarelliJ. Wirandi, A. Lauber, Amd W. J. KuleszaA. Ferrero And S. SaliconeM. Brandner And T. ThurnerA. Denguir-Rekik, H. Mauris, And J. MontmainT.E. Lovett, F. Ponci, And A. MontiL. Angrisani, M. D’apuzzo, And R. S. Lo MorielloO. Andrisano, A. Conti, D. Dardari, And A. RoversiD. Baderna, A. Cabrini. And G. TorelliS. Baglio And N. SavalliE. Bennoit, A. Chovin, L. Fuolloy, A. Chatenay, And G. MaurisS.C. Bera, J.K. Ray, And S. ChattopadhyayA. Bermak And S.B. BelhouariD.V. Bhatt, S. Schulze, And G.P. Hancke

-Special Section On Advanced Methods For Uncertainty Estimation In Measurement-A. Ferrero, pp. 690 -An Experimental Comparison In The Uncertainty Estimation Affecting Wavelet-Based Signal Analysis By Means Of The Iec-Iso Guide And Random-Fuzzy Approaches-S. Salicone And Tinarelli, pp. 691 -Problem Of Applying Modern Uncertainty Concepts To The Measurement Of Instrument-Specific Parameters-J. …

Edisi
VOL.55, NO.3, JUNE 2006
ISBN/ISSN
0018-9456
Deskripsi Fisik
691-1020 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i