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Ditemukan 2 dari pencarian Anda melalui kata kunci: author="l. Benetazzo"
cover
Transactions On Instrumentation And Measurement: A Publication Of The IEEE …
Komentar Bagikan
A.J. Lopez-MartinS. de WaeleA. FerreroA. FortL. DziudaS. SaliconeJ. SchoukensC.E LinM.J. NiemannV. H. HansJ.L. De la RosaG. FleuryM. -E. DavoustY. RolainG. SimonR. PintonA. GeensW. Von MoerN. TadicD. GobovicQ. WangY ShenY. ZhangJ.Q. ZhangM.BertoccoR. TittotoE. Rizzil. BenetazzoP.M.T. BroersenM. D'ArcoC.-C.LiA.-S. HouC.C. WuC. MuscasS. RocchiJ. I. OsaM. ZusaA. CarlosenaL.CristaldiR. TinarelliC. Di NucciL. Tondi. V. VignoliF. Di FrancescoM. B.Serrano SantosB. SchweighoferK. M. RaabG. BrasseurP. NiewczasL. Angrisani. M. D'ApuzzoB. C. WaltripM. SolomouA. AnopchenkoH. ZhangL. Yang

-Guest Editorial-r. Sasdelli, pp. 994 -A Real-Time Remote Control Architecture Using Mobile Communication-C.E Lin, C.-C.Li, A.-S. Hou And C.C. Wu, Pp. 997 -Phase Reconstruction Of Modulated Ultrasonic Signals And New Measurement Technique Of Flow Velocity-M.J. Niemann And V. H. Hans, Pp. 1004 -Minimum-Entropy, PDF Approximation, And Kernel Selection For Measurement Estimation-J.L. De La Rosa…

Edisi
Vol.52, No.4, August 2003
ISBN/ISSN
0018-9456
Deskripsi Fisik
pp. 994-1346 ill; 30cm
Judul Seri
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No. Panggil
REF 620 TIM i c.1
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
J. DiH. LiR. RajsumanR. Schiano Lo MorielloA. CarulloM. ParvisA. VallanR. Tittotol. BenetazzoA. BaccigalupiS. R. DasJ.-Y RyuB. C. KimI. SyllaY. HanX LiA. ChandraM.-K. ChenC-C. TaiY.-J HuangD. P VasudevanP .K. LalaJ. P. ParkersonR. X. GaoZ. FanC. Affolderbach, F DrozG. MiletiE. Angelini, F FerrarisV. GalloneS. GrassiniL. Angrisani,P A. PegoraroW. J. BurgerG. CrupiN. Donato

-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…

Edisi
VOL.55, NO.2, APRIL 2006
ISBN/ISSN
0018-9456
Deskripsi Fisik
378-688 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i