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Ditemukan 3 dari pencarian Anda melalui kata kunci: author=H. Lin
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
S. de WaeleL. AngrisaniA. FortJ. SchoukensP.M.T. BroersenM. D'ApuzzoM. D'ArcoS. OsowskiT. H. LinhK. Brudzewskic. RebaiD. DalletP. MarchegayJ. BojkovskiV. BatageljI. PušnikJ. DrnovšekM. b.YearyR. FinkD. BeckD. GuidryM. BurnsE. GhianiN. LocciC. MuscasA. BernierG. BettaL. FerrignoM. LaraccaA. BaccigalupiM. Pastorino, S. CaorsiA. MassaA. RandazzoC. LiguoriA. PaolilloM. JaskulaR.KaszynskiP. Petrovic,Y.RolainW. Van MoerG. VandersteenP.Carbonen. MachettiS. RocchiM. Serrano SantosN. UlivieriK. Vignoli

-New Digital Signal-Processing Approach for Transmitter Measurements in Third Generation Telecommunications Systems-L. Angrisani, M. D'Apuzzo, and M. D'Arco, pp. 622 -Neuro-Fuzzy TSK Network for Calibration of Semiconductor Sensor Array for Gas Measurements-S. Osowski, T. H. Linh, and K. Brudzewski, pp. 630 -Neuro-Fuzzy Network for Flavor Recognition and Classification-S. Osowski, T. H. Linh,…

Edisi
VOL.53, NO.3, JUNE 2004
ISBN/ISSN
0018-9456
Deskripsi Fisik
622-880 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
Komentar Bagikan
S. MouradS.R. DasJ. SavirR.X. GaoD. KayS.ChungK.A. TaylorB. NelsonA. ChongH. LinE. ChanM. SomaH. HaggagJ. HuardJ. BraatzA.S. HouC.-L. HsuY. LaiS.-W. WangJ.W. SheppardM.A. KaufmanA. JoskoR.J. RakM. AielloA. CataliottiS. NuccioC. Alippi,M. CatelaniA. FortM. MugnainiB. AndoS. GrazianoP. Pitrone

-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…

Edisi
VOL.54, NO.3, JUNE 2005
ISBN/ISSN
0018-9456
Deskripsi Fisik
939-1342 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE Transaction on Education : A Publication of the IEEE Education Society, …
Komentar Bagikan
WilsonC. -S.LeeJ. -H. ChangG. -H. LinV. GarousiS. DasS. A. YostM. KrishnanJ. P. BeckerT. WolfF. ColaceM. De SantoA. NonclercqA. V. BiestK. De CuyperE. LeroyD. L. MartinezF. RobertD. BraunRiba RuizGarcia EspinosaRomeralA. J. SwartN. AlianeC. -A. ChanM. HostFeldtLudersBranckenburyPlanaJ. PepperWilcockMcNallySwabeyA. BehrensT. AachHameyerNollHeroldNeumannSchwannL. Atorf

IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 53 Number 2, May 2010 contains of: - A Project-based laboratory for learning embedded system design with industri support - C.-S. Lee, pp. 173 - Applying peer reviews in software engineering education: an experiment and lessons learned - . Garousi, pp. 182 - A 10-year mechatronics curriculum development initi…

Edisi
Volume 53 Number 2, May 2010
ISBN/ISSN
0018-9359
Deskripsi Fisik
pp. 173-318
Judul Seri
-
No. Panggil
REF 620 TIM i c.1