-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…
-Indirect Measurement Within Dynamical Context: Probabilistic Approach To Deal With Uncertainly -H. Baili And G.A Fleury, pp. 1449 -Integration Of Dependability In A Task Allocation Problem- F. Bicking, B. Conrard, And J.-M. Thiriet, pp.1445 -Evaluating The Repaor Of System-On-Cjip(SoC) Using Connectivity-M. Choi, N. Park, V. Piuri, And F. Lombardi, pp.1464 -A Tunable Split Resonator Method …