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Ditemukan 1 dari pencarian Anda melalui kata kunci: author=S.-W. Wang
: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…
- Edisi
- VOL.54, NO.3, JUNE 2005
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 939-1342 hlm, ill; 30cm
- Judul Seri
- -
- No. Panggil
- REF 620 TIM i
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