-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…
-Special Section on IST 2004- G. C. Giakos, pp. 1867 -Design and Implementation of Web-Based Systems for Image Segmentation and CBIR-M. Antonelli, S. G. Dellepiane, and M. Goccia, pp. 1869 -An Innovative Microwave-Imaging Technique for Nondestructive Evaluation: Applications to Civil Structures Monitoring and Biological Bodies Inspection-M. Benedetti, M. Donelli, A. Martini, M. Pastorino, A…
-Guest Editorial-S.R. Das And R. Rajsuman, pp. 1350 -Space Compaction Of Test Responses Using Orthogonal Transmission Functions- K. Chakabarty And M. Seuring, pp. 1353 -Parity Bit Signature In Response Data Compaction And Built-In Self-Testing Of VLSI Circuits With Nonexhaustive Test Sets-S.R. Das, M. Sudarma, M.H. Assaf, E. M. Petriu, W.-B. Jone, K. Chakrabarty, And M. Sahinoglu, pp. 1363 …
-Guest Editorial-N. Park And F. Lombardi, pp. 1694 -Special Selection Papers: An Embryonic Approach To Reliable Digital Instrumentation Based On Evolvable Hardware-V. Sahni And V.P. Pyara, pp. 1696 -The Design Of Reliable Devices For Mission-Critical Applications-C. Bolchini, L. Pomante, F. Salice, And D. Scuito, pp. 1703 -Modeling And Analysis Of Soft -Test/Repair For CCD-Based Digital X-Ra…
-Guest Editorial, 22nd IEEE Instrumentation And Measurement Technology Conference-R.A Goubran And V.Z. Groza, pp. 1023 -Special Issue Papers, Security Monitoring Using Microphone Arrays And Audio Classification-A.R. Abu-El-Quran, R. A. Goubran, And A. D. C. Chan, pp. 1025 -High-Resolution Absorption Coefficient And Refractive Index Spectra Of Carbon Monoxide Gas At Milimeter And Submilimeter …
IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 53 Number 3, August 2010 contains of: - integrating asynchronous digital design into the computer engineering curriculum - S.C. Smith, W. K. Al-Assadi, pp. 349 - Educational experiences detecting, using, and representing ternary relationships in database design - D. Cuadra, Iglesias Maqueda, pp. 358 - Amplitu…
IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 54 Number 2, May 2011 contains of: - The impact of providing unlimited access to programmable boards in digital design education - M. E. radu, C. Cole, Dabacan, J. Harris, and S, sEXTN, PP. 174 - Improvements to an electrical engineering skill audit exam to improve student mastery of Core EE Concepts - D.W. Pa…
IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 52 Number 3, August 2009 contains of: - Imprortant role of the hall effect measurement system in a modified course of materials in electrical engineering - Stanvic, Savic, pp. 297 - Introduction of synchronous peer collaboration activities in a distance learning course - Xenos, N. Avouris, Margaritis, pp. 305 …
IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 52 Number 1, February 2009 contains of: - Component-based approach for educating students in bioinformatics - D. Poe, N. Venkatraman, C. Hansen, and G. Singh, pp. 1 - Experimental validation of the learning effect for a pedagogical game on computer fundamentals - G. Sindre, L. Natvig, and M. Jahre, pp.10 - A …
IEEE Transaction on Education : A Publication of the IEEE Education Society, Volume 54 Number 4, November 2010 contains of: - Effective teaching of the physical design of integrated circuits using educational tools - S.M. Aziz, E. Sicard, and Ben Dhia,pp. 517 - A wireless communications system laboratory course - Guzelgoz and Arslan, pp. 532 - Understanding computation of impulse response in…