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: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…
- Edisi
- VOL.54, NO.3, JUNE 2005
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 939-1342 hlm, ill; 30cm
- Judul Seri
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- No. Panggil
- REF 620 TIM i
Bulletin of Electrical Engineering and Informatics, Vol 4, No 1 - No 4, Maret…
-Evaluating the Radiation and Temperature Effect on Photovoltaic Systems, Sobhan Dorahaki, 1-6 -Machine model based Speed Estimation Schemes for Speed Encoderless Induction Motor Drives: A Survey, Mohan Krishna.S, Febin Daya.J.L, 7-17 -Numerical Investigation of Heat Transfer Enhancement in a Circular Tube with Rectangular Opened Rings, Arkan Altaie, Moayed R. Hasan, Farhan Lafta Rashid, 18-2…
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- Vol 4, No 1, Maret 2015
- ISBN/ISSN
- 2302-9285
- Deskripsi Fisik
- 1-82 hlm
- Judul Seri
- jurnal of Bulletin of Electrical Engineering and Informatics
- No. Panggil
- REF 620 TIM b
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