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IEEE Transactions On Instrumentation And Measurement: A Publication Of The …
-First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 1559 -Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence characterization-S. R. Das, C. V Ramamoorthy, M. H. Assaf E. M. Petriu, W-B. Jone, and M. Sahinoglu, …
- Edisi
- Vol.54, No.5, October 2005
- ISBN/ISSN
- 0018-9359
- Deskripsi Fisik
- pp. 1659-2129, ill; 30cm
- Judul Seri
- -
- No. Panggil
- REF 620 TIM i c.1
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…
- Edisi
- VOL.55, NO.2, APRIL 2006
- ISBN/ISSN
- 0018-9456
- Deskripsi Fisik
- 378-688 hlm, ill; 30cm
- Judul Seri
- -
- No. Panggil
- REF 620 TIM i
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