Journal Of Indonesian Economy And Business, Volume 29, Number 1, January 2014, berisi: GREASE OR SAND THE WHEEL? THE EFFECT OF INDIVIDUAL BRIBES ON THE DRIVERS OF AGGREGATE PRODUCTIVITY GROWTH Julien Hanoteau, Virginie Vial, 1-16 INFLUENCE OF WORK-FAMILY CONFLICT AND FAMILY-WORK CONFLICT ON EMPLOYEES’ TURNOVER INTENTIONS WITH GENDER, SOCIAL SUPPORT AND INDIVIDUAL VALUE AS MODERATING EFFECT…
EKUITAS, Jurnal Ekonomi dan Keuangan, Vol. 18 No. 4 - Desember 2014 berisi: - Quality of Life and Place Attachments Relationships to Destination Competitive Strategies, Ratna Roostika - 411 - Desentralisasi fiskal dan Perbuahan struktur ekonomi: studi perbandingan kawasan sulawesi dan jawa, Muh. Amir Arham - 43 - Analisis faktor-faktor yang mempengaruhi indeks pembangunan manusia di Indonesi…
-Guest Editorial- R. F Wolffenbuttel and C. J. van Mullen, pp. 1467 -The Relationship Between Microsystem Technology and Metrology-R. F Wolffenbuttel and C J. van Mullen, pp. 1469 -IC Fabrication Compatible Processing for Insirumentation and Measurement Applications-D.D. L. Wijngaards and R F Wolfenbuttel, pp. 1475 -Development of Thin-Film Multijunction Thermal Converters at PTB/IPHT-M. Klo…
-Improving the Convergence Rate of Jansson's Deconvolution Method-P. B. Crilly, A. Bernardi, P. A. Jansson, and L. E. B. da Silva, pp. 1142 -Capacitive Sensor for Relative Angle Measurement- P. Fulmek, F. Wandling, W. Zdiarsky, G. Brasseur, and S. Cermak, pp. 1150 -Effects of DUT Mismatch on the Noise Figure Characterization: A Comparative Analysis of Two Y-Factor Techniques-J.-M. Collantes, …
-Study of Micromanipulation Using Stereoscopic Microscope- H. Yamamoto and T. Sano, pp. 182 -Flatness Measurement System Based on a NonLinear Optical Triangulation Technique- D. F Garcia, M. Garcia, F. Obeso, and V. Fernandez, pp. 188 -Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Networks- M. Catelani a…
-First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 1559 -Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence characterization-S. R. Das, C. V Ramamoorthy, M. H. Assaf E. M. Petriu, W-B. Jone, and M. Sahinoglu, …
-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…
-Guest Editorial-Ottoboni and S. Demidenko, pp. 1346 -With Leakage Minimization-D.Agrez, pp. 1347 -Digital Processing of Dual-Frequency Servo Burst in Hard Disk Drives- A. Al Mun. G. Guo, K. C. Tan, And Y.Liu, pp. 1354 -A Digital Tachometer for High-Temperature Telemetry Utilizing uprated Commercial Electronic Components- D. Ambrush, V. Bilas, And D. Vasic, pp. 1361 -Effects of Driving Mod…
-Guest Editorial-G. Jones, pp. 476 -Foreword-S. Pollit, pp. 478 -Ac Power Measurements; Callibration System For Electronic Instrument Transformers With Digital Output-B.Djokic And E. So, pp. 479 -Precision Measurement Of Power Harmonics And Flickers-I. Budovski And G. Hammond, pp. 483 -A Wavelet-Based Method Of Measuring Fluctuating Harmonics For Determining The Filter Time Constant Of IEC …
-Guest Editorial-U. Feller, pp. 225 -Optical Frequency Standards And Measurement-J. L. Hall, And J. Ye, pp. 227 -The BIPM Laser Standards At 663 Nm And 532 Nm Simultaneously Linked To The SI Second Using A Femtosecond Laser In In An Optical Clock Configurations- L.-S. Ma, L. Robertsson, S. Picard, J.-M. Chartier, H. Karlsson, E. Prieto, And R.S. Windeller, pp.32 -Results From International …