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Ditemukan 3 dari pencarian Anda melalui kata kunci: subject="Built-In Self-Test"
cover
IEEE Transactions On Instrumentation And Measurement: A Publication Of The …
Komentar Bagikan
F. LombardiL. SchianoR. RajsumanM. SahinogluS. R. DasC. V RamamoorthyM. H. Assaf E. M. PetriuW-B. JoneN. MasudaK. YamashitaW. R. EisenstadtR. M. FoxT. ZhangV. NarayananX. XiongY-L. WuA. LaknaurH. HashempourF. J. MeyerJ. M. CazeauxM. OmañaC. MetraC. V. RamamoorthyR. RosalesT. FarahmandS. TabatabaeiA. Ivanov

-First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 1559 -Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence characterization-S. R. Das, C. V Ramamoorthy, M. H. Assaf E. M. Petriu, W-B. Jone, and M. Sahinoglu, …

Edisi
Vol.54, No.5, October 2005
ISBN/ISSN
0018-9359
Deskripsi Fisik
pp. 1659-2129, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i c.1
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
J. DiH. LiR. RajsumanR. Schiano Lo MorielloA. CarulloM. ParvisA. VallanR. Tittotol. BenetazzoA. BaccigalupiS. R. DasJ.-Y RyuB. C. KimI. SyllaY. HanX LiA. ChandraM.-K. ChenC-C. TaiY.-J HuangD. P VasudevanP .K. LalaJ. P. ParkersonR. X. GaoZ. FanC. Affolderbach, F DrozG. MiletiE. Angelini, F FerrarisV. GalloneS. GrassiniL. Angrisani,P A. PegoraroW. J. BurgerG. CrupiN. Donato

-Second Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 378 -A New Low-Cost RF Built-In Self-Test Measurement for System-on-Chip Transceivers-J.-Y Ryu, B. C. Kim, and I. Sylla, 381 -Embedded Test Resource for SoC to Reduce Required Tester Channels Based on Advanced -Convolutiona…

Edisi
VOL.55, NO.2, APRIL 2006
ISBN/ISSN
0018-9456
Deskripsi Fisik
378-688 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
Komentar Bagikan
S. MouradS.R. DasJ. SavirR.X. GaoD. KayS.ChungK.A. TaylorB. NelsonA. ChongH. LinE. ChanM. SomaH. HaggagJ. HuardJ. BraatzA.S. HouC.-L. HsuY. LaiS.-W. WangJ.W. SheppardM.A. KaufmanA. JoskoR.J. RakM. AielloA. CataliottiS. NuccioC. Alippi,M. CatelaniA. FortM. MugnainiB. AndoS. GrazianoP. Pitrone

-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…

Edisi
VOL.54, NO.3, JUNE 2005
ISBN/ISSN
0018-9456
Deskripsi Fisik
939-1342 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i