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Ditemukan 7 dari pencarian Anda melalui kata kunci: subject="circuits"
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Rangkaian Listrik
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Cekmas CekdinTaufik Barlian

Buku ini berbeda dari buku-buku lainnya karena memiliki keunggulan dalam kajiannya. Teori yang diberikan singkat dan padat, disertai contoh dan penyelesaian yang lengkap dan tuntas. Soal latihan diberikan untuk membantu pembaca dalam memahami isi buku ini sehingga mengerti lebih luas tentang rangkaian listrik. Pokok bahasan dalam buku ini mencakup: - Komponen-komponen dasar pada rangkaian lis…

Edisi
Ed.1
ISBN/ISSN
978-979-29-3513-4
Deskripsi Fisik
xiv + 370 hlm. ; 19 x 23 cm
Judul Seri
-
No. Panggil
621.319 CEK r
cover
IEEE Transactions On Instrumentation And Measurement: A Publication Of The …
Komentar Bagikan
L. AngrisaniS. BaglioB. HuyartM. CatelaniM. D'ApuzzoA. BaccigalupiIlmu HukumR. NicolettiS. A. ChahineE. BergeaultL. P. JalletH. LiuD. W MillerJ. C. PedroN. B. de CarvalhoB. Rajesh KumarK. SridharanK. SrinivasanH.-T LueJ.-T LueT.-Y TsengW T KuangA. S. MorrisD. PetriM. BrudkaA. PacutA. RoutrayA. K. Pradhan,Fak. HukumK. P. RaoA. P. J. van DeursenJ. B. M. van Waes,J. AguileraG. MatíasJ. de NóA. García-AlonsoR. BerenguerA. M. ProkhorenkovS. K. GoumasM. E. ZervakisG. S. StavrakakisA. H. TanK. GodfreyG. MuscatoN. Savalli,J. A. R. BallM. StucchiK. MaexF. AminianM. AminianH. W CollinsL. BelostotskiT L. LandeckerD. RoutledgeM. De DominicisF GianniniE. LimitiG. Saggio

-Study of Micromanipulation Using Stereoscopic Microscope- H. Yamamoto and T. Sano, pp. 182 -Flatness Measurement System Based on a NonLinear Optical Triangulation Technique- D. F Garcia, M. Garcia, F. Obeso, and V. Fernandez, pp. 188 -Soft Fault Detection and Isolation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Networks- M. Catelani a…

Edisi
Vol.51, No.3, June 2002
ISBN/ISSN
0018-9456
Deskripsi Fisik
182-398 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE Transactions On Instrumentation And Measurement: A Publication Of The …
Komentar Bagikan
F. LombardiL. SchianoR. RajsumanM. SahinogluS. R. DasC. V RamamoorthyM. H. Assaf E. M. PetriuW-B. JoneN. MasudaK. YamashitaW. R. EisenstadtR. M. FoxT. ZhangV. NarayananX. XiongY-L. WuA. LaknaurH. HashempourF. J. MeyerJ. M. CazeauxM. OmañaC. MetraC. V. RamamoorthyR. RosalesT. FarahmandS. TabatabaeiA. Ivanov

-First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing-Future of Semiconductor Test-S. R. Das and R. Rajsuman, pp. 1559 -Revisiting Response Compaction in Space for Full-Scan Circuits With Nonexhaustive Test Sets Using Concept of Sequence characterization-S. R. Das, C. V Ramamoorthy, M. H. Assaf E. M. Petriu, W-B. Jone, and M. Sahinoglu, …

Edisi
Vol.54, No.5, October 2005
ISBN/ISSN
0018-9359
Deskripsi Fisik
pp. 1659-2129, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i c.1
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: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF TH…
Komentar Bagikan
S. MouradS.R. DasJ. SavirR.X. GaoD. KayS.ChungK.A. TaylorB. NelsonA. ChongH. LinE. ChanM. SomaH. HaggagJ. HuardJ. BraatzA.S. HouC.-L. HsuY. LaiS.-W. WangJ.W. SheppardM.A. KaufmanA. JoskoR.J. RakM. AielloA. CataliottiS. NuccioC. Alippi,M. CatelaniA. FortM. MugnainiB. AndoS. GrazianoP. Pitrone

-Guest Editorial-R.X. Gao, pp. 939 -Getting Errors To Catch Themselves-Self-Testing Of VLSI Circuits With Built-In Hardware-S.R. Das, pp. 941 -Embedded Ttest Control Schemes Using iBIST For SOCs-D. Kay, S.Chung, And S. Mourad, pp. 956 -Built In Online And Offline Test Of Airbone Digital Systems-J. Savir, pp.965 -Special Issue On Bit CMOS Built-In Test Architecture For High Speed Jitter Me…

Edisi
VOL.54, NO.3, JUNE 2005
ISBN/ISSN
0018-9456
Deskripsi Fisik
939-1342 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
S. MouradFak. HukumE. M. PetriuS.R. DasR. RajsumanK. ChakabartyM. SeuringM. SudarmaM.H. AssafW.-B. JoneM. SahinogluD.C. HuangP.K. LalaA. L. BurresS.L. LinS. KrishnanJ. SavirZ. GuoA.M. ShethS.F.-C. TsengW.T.-K. ChienE. GongB.-C CaiS. BaglioL. AntoniR. LeveugleB. FeherS.Y.C. CatundaJ.-F. NavinerG. S. DeepR.C.S. FreireS. Abou ChahineB. HuyartJ. AchkarS. Chen,D.-Y. JengH. HadanoY. IshiguroM. NayakamaK. WatanabeT. Chiu

-Guest Editorial-S.R. Das And R. Rajsuman, pp. 1350 -Space Compaction Of Test Responses Using Orthogonal Transmission Functions- K. Chakabarty And M. Seuring, pp. 1353 -Parity Bit Signature In Response Data Compaction And Built-In Self-Testing Of VLSI Circuits With Nonexhaustive Test Sets-S.R. Das, M. Sudarma, M.H. Assaf, E. M. Petriu, W.-B. Jone, K. Chakrabarty, And M. Sahinoglu, pp. 1363 …

Edisi
VOL.52, NO.5, OCTOBER 2003
ISBN/ISSN
0018-9456
Deskripsi Fisik
1350-1692 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i
cover
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT: A PUBLICATION OF THE …
Komentar Bagikan
Teknik Mesin, S. BongarZ. BenyoZ. HuangB. WangH. LiA. RonkL. Angrisani, A. Baccigalupi, And G. D’ AngioloM.G. Cox, M.P. Dainton, N.M. Ridler, M.J. Salter, And P.R. YoungS. Acunto, P. Arpaia, D.M. Hummels, And F.H. IronsT. Sentenac, Y. Le Maoultt, G. Rolland, And M. DevyR. Pintelon, Y. Rolain,And W. Van MoerF.A. Correa AlegriaA.M. Da Cruz SerraG. BucciE. FiorucciC. LandiA. Caddemio And N. DonatoB. Vodros And I. KollarZ. Czaja And R. Zielonko

-Detection Of Airway Obstructions And Sleep Apnea By Analyzing The Phase Relation Of Respiration Movement Signals-P. Varady, S. Bongar, And Z. Benyo, pp. 2 -Application Of Electrical Capacitance Tomography To The Void Fraction Measurement Of Two-Phase Flow-Z. Huang, B. Wang, And H. Li, pp. 7 -Analysis And Reproduction Of A Signal’s Periodic Components By Means Of An Extended Block-Adaptive …

Edisi
VOL.52, NO.1, FEBRUARY 2003
ISBN/ISSN
0018-9456
Deskripsi Fisik
2-215 hlm, ill; 30cm
Judul Seri
-
No. Panggil
REF 620 TIM i